Parameter Design to Improve Yield in Integrated Circuit Assembly Plant

Wawolumaja, Rudy (2003) Parameter Design to Improve Yield in Integrated Circuit Assembly Plant. Jurnal Teknik dan Manajemen Industri, e (1). pp. 15-29. ISSN 1411-934X

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Abstract

This paper describes design of experiment using Taguchi techniques in parameter design in improving yield performance of wire wash in PDIP (Plastic Dual In Line Package) assembling company. Taguchi approach applies statistical experimental design in the area of 'Off Line Quality Control' , that refers to the improvement of quality in the product and process development stages. Taguchi techniques in parameter design is used to improve process without eliminating cause of variation or noise factor.

Item Type: Article
Subjects: T Technology > TS Manufactures
Depositing User: Perpustakaan Maranatha
Date Deposited: 21 Jan 2012 04:40
Last Modified: 21 Jan 2012 04:40
URI: http://repository.maranatha.edu/id/eprint/10

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